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Improved statistical model checking methods for pathway analysis

Interactive presentations are expected to articulate emerging and future design, verification and test problems including work in progress and identify open problems that merit innovative future research. Accepted papers will be published in the conference proceedings max four pages and will be presented in a face-to-face discussion area.

Emulation of vintage integrated circuits through die analysis and reverse-EDA

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To permit blind review, manuscripts should not include the author names nor affiliations. Manuscripts not in line with the above rules might be discarded. For a paper to be considered a valid submission, at least a title, abstract, and the complete list of authors cannot be modified after Sunday, September 09, CET should be submitted by this date. The full paper up to six pages can be submitted at the same time or later, but must be uploaded at the latest by Sunday, September 16, CET. Otherwise the initial submission will be automatically withdrawn.